T. Yoshizawa – Handbook of Optical Metrology (Second edition, 2015)

4.930 ₽

Автор: T. Yoshizawa
Название книги: Handbook of Optical Metrology (Second edition)
Формат: PDF
Жанр: Физика
Страницы: 906
Качество: Изначально компьютерное, E-book

Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text:

Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements
Addresses interferometry, holography, and speckle methods and applications
Explains Moiré metrology and the optical heterodyne measurement method
Delves into the specifics of diffraction, scattering, polarization, and near-field optics
Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes
This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters―nearly 100 pages―on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

I am very happy for this chance to revise the handbook first published in 2009. Up to now, numerous
books and handbooks with such titles as Optics and Optical Engineering have been published.
However, it was still not easy for people to apply those optical principles to their research or for
industrial purposes. In this handbook, I, as the editor, have attempted to bridge the gap that exists
between academic research principles and the methods used for practical applications.
To my great delight, we received a number of favorable responses to the previous edition, especially
from researchers and engineers in industrial fields, in addition to people in academic areas.
Therefore, my intention here is to update the ten chapters whose authors needed to revise on the
basis of recent development and progress in their specific fields. In one instance, devices such as
CCD (charge-coupled device)/CMOS (complementary metallic-oxide-semiconductor) cameras
in imaging technology have made remarkable progress since 2009, which enabled downsizing in
shape and high definition in resolution. Consequently, combining optical principles and new device
technologies has expanded the areas of application. This created a kind of synergistic effect that
new principles are born inspired by new elements and devices. At the same time, based on requests
from readers in related areas, four new chapters have been added. Naturally, we would have liked
to include even more topics, but as always it is difficult to cover everything due to various practical
restrictions.
The very rapid progress in fundamental research, applied techniques, and device technology
has, I found, made it difficult to achieve ideal contents. In a short period, many novel ideas may be
reported and instruments and equipment for practical use commercialized before it is clear whether
or not they are successful in the market.
I will be delighted if this update makes the handbook more useful for people who are seeking
solutions to their problems using optical principles and methods described here. I shall gratefully
receive any comments, suggestions, and advice from readers.
Toru Yoshizawa

Описание

Handbook of Optical Metrology (Second edition, 2015) от T. Yoshizawa — это фундаментальное справочное издание, посвященное современным методам оптических измерений. Книга подробно рассматривает принципы, приборы и технологии, которые используются для точного контроля геометрических параметров, формы, шероховатости и оптических характеристик материалов и изделий.

Второе издание значительно расширено: добавлены главы о новых типах интерферометров, конфокальной микроскопии, цифровой голографии, 3D-сканировании, спектроскопии и применении оптической метрологии в нанотехнологиях, полупроводниковой промышленности и биомедицине. Автор уделяет внимание как теоретическим основам, так и практическим аспектам реализации измерительных систем.

  • Инженерам-оптикам и метрологам, работающим с прецизионными измерениями
  • Специалистам в области производства и контроля качества в электронике, машиностроении и аэрокосмической отрасли
  • Исследователям и аспирантам, изучающим оптические методы диагностики
  • Разработчикам измерительного оборудования и систем машинного зрения

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